MAC: Maximal Cliques for 3D Registration

Published in IEEE Transactions on Pattern Analysis and Machine Intelligence, 2024

Recommended citation: J. Yang, X. Zhang, P. Wang, et al. "MAC: Maximal Cliques for 3D Registration", in IEEE Transactions on Pattern Analysis and Machine Intelligence, doi: 10.1109/TPAMI.2024.3442911 https://ieeexplore.ieee.org/abstract/document/10636064